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The Ohio State University

NanoSystems Laboratory

Bruker Atomic Force/Magnetic Force Microscope (BAFM)

Bruker AXS Dimension Icon Atomic/Magnetic Force Microscope with ScanAsyst

Located in PRB 1159
  1. Vibration isolation and sound proof enclosure for low noise operation
  2. Closed loop scanner with scan range 90 µm x 90 µm
  3. Z sensor noise level (closed-loop) of 35 pm RMS typical in imaging bandwidth of 625 Hz
  4. Easy sample positioning with 5-megapixel digital camera with digital zoom and motorized focus
Modes of operation include:
  1. Atomic Force Microscopy (AFM) mode
  2. Magnetic Force Microscopy (MFM) mode
  3. PeakForce Quantitative Nanomechanical Property Mapping (PF-QNM) mode
  4. Scanned Capacitance Microscopy (SCM) mode
  5. Spatially resolved electrical characterization mode

Atomic Force/Magnetic Force Microscope (AFM)

Veeco Instruments Dimension 3000 Scanning Probe Microscope with Nanoscope IIIa Controller

Located in PRB 1159
  1. Additional Extender and Signal Access modules
  2. Vibration isolation and sound proof enclosure for low noise operation
  3. Atomic Force Microscopy Mode
  4. Magnetic Force Microscopy Mode
  5. Probe control: contact mode, tapping mode, lift mode