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The Ohio State University

NanoSystems Laboratory

X-ray Diffractometer (XRD)

Bruker D8 Discover High-Resolution Triple Axis X-Ray Diffractometer

Located in PRB 0177

  1. Third generation Göbel mirrors providing the highest X-ray flux density - essential for all thin film applications
  2. Easy and failsafe operation - tools like the motorized absorber allow fully automatic operation without user intervention
  3. High performance optics for optimum resolution
  4. X-ray source: Cu Kα1
  5. Data processing software includes Leptos and Topaz
  1. High resolution X-ray Diffraction
  2. Texture and Stress Analysis
  3. X-ray reflectometry
  4. Grazing Incidence Diffraction (GID)
  5. Powder Diffraction